Scanning probe microscopy : Volume-1
Scanning probe microscopy : Volume-1 electrical and electromechanical phenomena at the nanoscale /
Electrical and electromechanical phenomena at the nanoscale
Sergei Kalinin, Alexei Gruverman, editors.
- New York : Springer, c2007.
- 2 v. (xx, 980 p., [8] p. of plates) : ill. (some col.) ; 25 cm.
Includes bibliographical references and index.
9780387286679 (2v. set : hd.bd.)
2006926451
977347508 GyFmDB
Scanning probe microscopy.
Nanoelectronics.
QH212.S33 / S395 2007
502/.8/25
Includes bibliographical references and index.
9780387286679 (2v. set : hd.bd.)
2006926451
977347508 GyFmDB
Scanning probe microscopy.
Nanoelectronics.
QH212.S33 / S395 2007
502/.8/25