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Scanning probe microscopy : Volume-2

Scanning probe microscopy : Volume-2 electrical and electromechanical phenomena at the nanoscale / Electrical and electromechanical phenomena at the nanoscale Sergei Kalinin, Alexei Gruverman, editors. - New York : Springer, c2007. - 2 v. (xx, 980 p., [8] p. of plates) : ill. (some col.) ; 25 cm.

Includes bibliographical references and index.

ISBN: 9780387286679 (2v. set : hd.bd.)

LCCN: 2006926451

Nat. Bib. Agency Control No.: 977347508 GyFmDB

Subjects--Topical Terms:
Scanning probe microscopy.
Nanoelectronics.

LC Class. No.: QH212.S33 / S395 2007

Dewey Class. No.: 502/.8/25

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Scanning probe microscopy : Volume-2