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Verma, H. R.

Atomic and nuclear analytical methods : XRF, Mössbauer, XPS, NAA and ion-beam spectroscopic techniques / XRF, Mössbauer, XPS, NAA and ion-beam spectroscopic techniques H.R. Verma. - Berlin ; New York : Springer, c2007. - xiv, 375 p. : ill. ; 24 cm.

Includes bibliographical references (p. [341]-364) and index.

X-ray fluorescence (XRF) and particle-induced X-ray emission (PIXE) -- Rutherford backscattering spectroscopy -- Elastic recoil detection -- Mössbauer spectroscopy (MS) -- X-ray photoelectron spectroscopy -- Neutron activation analysis -- Nuclear reaction analysis and particle-induced gamma-ray emission -- Accelerator mass spectroscopy (AMS) -- Appendixes.

ISBN: 9783540302773 (acidfree paper)

Publisher. No.: 10908259

LCCN: 2006940685

Nat. Bib. No.: 05,N47,0602 dnb

Nat. Bib. Agency Control No.: 97689291X DE-101

Subjects--Topical Terms:
Atomic spectroscopy.
Nuclear spectroscopy.
Spectrum analysis.
Particles (Nuclear physics)
Spectroscopie.
Particules (Physique nucléaire)
Beschleuniger-Massenspektrometrie.
Ionenstrahlanalyse.
Mössbauer-Spektroskopie.
Neutronenaktivierungsanalyse.
Röntgen-Photoelektronenspektroskopie.
Röntgenspektroskopie.

LC Class. No.: QC454.A8 / V47 2007