Raman Research Institute Library OPAC

Raman Research Institute Library OPAC

Testing complex and embedded systems / (Record no. 26821)

MARC details
000 -LEADER
fixed length control field 01865cam a2200325 a 4500
001 - CONTROL NUMBER
control field 16528324
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20191111143210.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 101102s2011 flua b 001 0 eng
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER
LC control number 2010043713
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781439821404 (hardback)
040 ## - CATALOGING SOURCE
Original cataloging agency DLC
Modifying agency DLC
042 ## - AUTHENTICATION CODE
Authentication code pcc
050 00 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TK7895.E42
Item number P738 2011
082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 004.16
Edition number 22
084 ## - OTHER CLASSIFICATION NUMBER
Classification number COM051230
-- TEC008000
-- TEC009000
Number source bisacsh
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Pries, Kim H.,
Dates associated with a name 1955-
245 10 - TITLE STATEMENT
Title Testing complex and embedded systems /
Statement of responsibility, etc. Kim H. Pries, Jon M. Quigley.
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Boca Raton :
Name of publisher, distributor, etc. CRC Press,
Date of publication, distribution, etc. c2011.
300 ## - PHYSICAL DESCRIPTION
Extent xxxi, 287 p. :
Other physical details ill. ;
Dimensions 24 cm.
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note Includes bibliographical references (p. 281) and index.
520 ## - SUMMARY, ETC.
Summary, etc. "Using combinatorial approaches, this book aims to motivate testers and testing organizations to perform meaningful testing. The text details planning activities prior to testing, how to scope the work, and how to achieve a successful conclusion. Rather than presenting the entire continuum of testing for a particular product or design attribute, this volume focuses on boundary conditions. The authors provide various techniques that can be used to streamline testing and help identify problems before they occur, including turbocharge testing methods from Six Sigma. Coverage includes testing, simulation, and emulation"--
Assigning source Provided by publisher.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Embedded computer systems
General subdivision Testing.
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element COMPUTERS / Software Development & Engineering / General
Source of heading or term bisacsh.
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element TECHNOLOGY & ENGINEERING / Electronics / General
Source of heading or term bisacsh.
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element TECHNOLOGY & ENGINEERING / Engineering (General)
Source of heading or term bisacsh.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name <a href="Quigley, Jon M.">Quigley, Jon M.</a>
906 ## - LOCAL DATA ELEMENT F, LDF (RLIN)
a 7
b cbc
c orignew
d 1
e ecip
f 20
g y-gencatlg
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Universal Decimal Classification
Koha item type Books
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Home library Current library Date acquired Total Checkouts Full call number Barcode Date last seen Price effective from Koha item type
    Universal Decimal Classification     Raman Research Institute Library Raman Research Institute Library 16.03.2012   681.32.06 PRI 26821 08.07.2020 16.03.2012 Books
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