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Automatic testing and evaluation of digital integrated circuits / James T. Healy.
Material type:
TextPublication details: Reston, Va. : Reston Pub. Co., c1981.Description: xvii, 236 p. : ill. ; 24 cmISBN: - 0835902560
- 621.381/73/0287 19
- TK7874 .H395
| Item type | Current library | Call number | Status | Date due | Barcode | |
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Raman Research Institute Library | 621.382.4D HEA (Browse shelf(Opens below)) | Available | 13121 |
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| 621.382.4D HAR Applications of VHDL to circuit design / | 621.382.4D HAS Low-power design of nanometer FPGAs : architecture and EDA / | 621.382.4D HAW Introduction to modern digital electronics | 621.382.4D HEA Automatic testing and evaluation of digital integrated circuits / | 621.382.4D HNA User's guidebook to digital CMOS integrated circuits / | 621.382.4D HOL Digital logic design | 621.382.4D HUN Digital/logic electronics handbook / |
Includes index.
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