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International conference on ellipsometry and other optical methods for surface and thin film analysis(June 7-10: 1983:Paris)

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Material type: Text

TextPublication details: Paris; J.de Physique; 1983Description: xviii p. + 533

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Item type	Current library	Call number	Status	Date due	Barcode
Books	Raman Research Institute Library	535.29(063) INT (Browse shelf(Opens below))	Available		14184

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Previous	535.29 WAL/II Photometry	535.29 WAL/III Photometry	535.29 ZWO Photocells and their application	535.29(063) INT International conference on ellipsometry and other optical methods for surface and thin film analysis(June 7-10: 1983:Paris)	535.31 AND Principles of modern optical systems	535.31 ASA International trends in optics and photonics: ICO IV	535.31 BEN Selected papers on three-dimensional displays	Next

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