Raman Research Institute Library OPAC

Raman Research Institute Library OPAC

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CMOS RF modeling, characterization and applications / editors, M. Jamal Deen, Tor A. Fjeldly.

Contributor(s): Material type: TextTextSeries: Selected topics in electronics and systems ; vol. 24Publication details: River Edge, N.J. : World Scientific, c2002.Description: xi, 409 p. : ill. ; 26 cmISBN:
  • 9810249055
Subject(s): DDC classification:
  • 621.39/732 21
LOC classification:
  • TK7871.99.M44 C577 2002
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Item type Current library Call number Status Date due Barcode
Books Books Raman Research Institute Library 621.382.4D DEE (Browse shelf(Opens below)) Available 22786

Includes bibliographical references.

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