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Reliability, testing, and characterization of MEMS/MOEMS III : 26-28 January, 2004, San Jose, California, USA / Danelle M. Tanner, Rajeshuni Ramesham, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
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TextSeries: Proceedings of SPIE--the International Society for Optical Engineering ; v. 5343.Publication details: Bellingham, Wash. : SPIE, c2004.Description: xxxi, 312 p. : ill. ; 28 cmISBN: - 0819452513
- 621.381 22
- TK7875 .R44 2004
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Raman Research Institute Library | 621.38.032.3 SPIE - 5343 (Browse shelf(Opens below)) | Available | 23315 |
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| 621.38.032.3 SID-S4/2006 Short course S-4: Fundamentals of vision and color science | 621.38.032.3 SIN Optoelectronics: An introduction to materials and devices | 621.38.032.3 SOC Proceedings: Seminar-in-depth on fiber optics. Applications and technology | 621.38.032.3 SPIE - 5343 Reliability, testing, and characterization of MEMS/MOEMS III : | 621.38.032.3 SPIE-5346 MOEMS and miniaturized systems IV : | 621.38.032.3 SPIE-5348 MOEMS display and imaging systems II : | 621.38.032.3 STE Technician's guide to fiber optics / |
Includes bibliographical references and author index.
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