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Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM / Ray F. Egerton.
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TextPublication details: New York, NY : Springer, c2005.Description: xii, 202 p. : ill. ; 25 cmISBN: - 0387258000
- QH212.E4 E354 2005
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Raman Research Institute Library | 535.315 EGE (Browse shelf(Opens below)) | Available | 23771 |
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| 535.315 DeG Introduction to conventional transmission electron microscopy / | 535.315 DIA Confocal and two-photon microscopy : | 535.315 DIE Confocal Raman microscopy / | 535.315 EGE Physical principles of electron microscopy : | 535.315 FIS Applied electron microscopy | 535.315 GOL Scanning electron microscopy and x-ray microanalysis / | 535.315 HAL Introduction to electron microscpy |
Includes bibliographical references (p. [195]-196) and index.
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