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Fundamentals of nanoscale film analysis / Terry L. Alford, Leonard C. Feldman and James W. Mayer.
Material type:
TextPublication details: New York, N.Y. ; London : Springer, c2007.Description: xiv, 336 p. : ill. ; 25 cmISBN: - 9780387292601 (hbk.)
- 621.3815/2 22
- QC176.83 .A44 2006
| Item type | Current library | Call number | Status | Date due | Barcode | |
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Books
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Raman Research Institute Library | 620.3 ALF (Browse shelf(Opens below)) | Available | 24559 |
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| 620.3 AGR Introduction to nanoscience and nanomaterials / | 620.3 AJA Nanocomposite science and technology / | 620.3 ALD Trends in nanophysics : | 620.3 ALF Fundamentals of nanoscale film analysis / | 620.3 AND Frontiers in surface nanophotonics : | 620.3 ASH "Nanomaterials, nanotechnologies and design: An introduction for engineers and architects" | 620.3 BAI Nanoconvergence : |
Includes bibliographical references and index.
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