Raman Research Institute Library OPAC

Raman Research Institute Library OPAC

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Self-checking and fault-tolerant digital design / Parag K. Lala.

By: Material type: TextTextPublication details: San Francisco : Morgan Kaufmann, c2001.Description: xii, 216 p. : ill. ; 25 cmISBN:
  • 9780124343702
Subject(s): DDC classification:
  • 004.2 21
LOC classification:
  • TK7888.3 .L274 2001
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Holdings
Item type Current library Call number Status Date due Barcode
Books Books Raman Research Institute Library 621.382.4D LAL (Browse shelf(Opens below)) Available 24580

Includes bibliographical references and index.

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