Raman Research Institute Library OPAC

Raman Research Institute Library OPAC

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Next generation wireless LANs : throughput, robustness, and reliability in 802.11n / Eldad Perahia and Robert Stacey.

By: Contributor(s): Material type: TextTextPublication details: Cambridge, UK ; New York : Cambridge University Press, 2008.Description: xxx, 385 p. : ill. ; 26 cmISBN:
  • 9780521885843 (hbk.)
Subject(s): DDC classification:
  • 621.39/8 22
LOC classification:
  • TK5105.78 .P47 2008
Online resources:
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Includes bibliographical references and index.

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