Raman Research Institute Library OPAC

Raman Research Institute Library OPAC

Amazon cover image
Image from Amazon.com

Fundamentals of nonlinear behavioral modeling for RF and microwave design / John Wood, David E. Root, editors.

Contributor(s): Material type: TextTextSeries: Artech House microwave libraryPublication details: Boston : Artech House, c2005.Description: xii, 221 p. : ill. ; 24 cmISBN:
  • 9781580537759
Subject(s): DDC classification:
  • 621.384/12 22
LOC classification:
  • TK6560 .F86 2005
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Maintained by RRI Library