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Characterization of organic thin films / editor, Abraham Ulman ; managing editor, Lee E. Fitzpatrick.
Material type:
TextSeries: Materials characterization seriesPublication details: Boston : Butterworth-Heinemann ; Greenwich : Manning, c1995.Description: xvi, 276 p. : ill. ; 25 cmISBN: - 9781606500446
- 530.4/175 20
- QC176.9.O73 C48 1995
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Raman Research Institute Library | 538.971 ULM (Browse shelf(Opens below)) | Available | 26805 |
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| 538.971 SUT Interfaces in crystalline materials / | 538.971 TRE Order in thin organic films. | 538.971 ULM An introduction to ultrathin organic films - from Langmuir-Blodgett to self assembly | 538.971 ULM Characterization of organic thin films / | 538.971 VAS Optics of thin films | 538.971 WAN Solid-liquid interfaces : | 538.971 WIS Electrical resistivity of thin metal films / |
Includes bibliographical references and index.
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