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Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein ... [et al.].
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TextPublication details: New York : Kluwer Academic/Plenum Publishers, c2003.Edition: 3rd edDescription: xix, 689 p. : ill. (some col.) ; 26 cm. + 1 CD-ROM (4 3/4 in.)ISBN: - 9780306472923
- 502/.8/25 21
- QH212.S3 S29 2003
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Raman Research Institute Library | 535.315 GOL (Browse shelf(Opens below)) | Available | 26975 |
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| 535.315 DIE Confocal Raman microscopy / | 535.315 EGE Physical principles of electron microscopy : | 535.315 FIS Applied electron microscopy | 535.315 GOL Scanning electron microscopy and x-ray microanalysis / | 535.315 HAL Introduction to electron microscpy | 535.315 JAC Introduction to electron optics | 535.315 KAY Techniques for electron microscopy |
Includes bibliographical references and index.
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