Raman Research Institute Library OPAC

Raman Research Institute Library OPAC

Amazon cover image
Image from Amazon.com

X-ray scattering from soft-matter thin films : materials science and basic research / Metin Tolan.

By: Material type: TextTextSeries: Springer tracts in modern physics ; 148Publication details: Berlin ; New York : Springer, c1999.Description: viii, 197 p. : ill. ; 24 cmISBN:
  • 3540651829 (alk. paper)
Subject(s): DDC classification:
  • 530.4/275 21
LOC classification:
  • QC1 .S797 vol. 148
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
Holdings
Item type Current library Call number Status Date due Barcode
Books Books Raman Research Institute Library 538.9SM TOL (Browse shelf(Opens below)) Available 23895

Includes bibliographical references (p. [179]-191) and index.

There are no comments on this title.

to post a comment.
Maintained by RRI Library