Scanning probe microscopy : Volume-2  electrical and electromechanical phenomena at the nanoscale / 
 Electrical and electromechanical phenomena at the nanoscale 
Sergei Kalinin, Alexei Gruverman, editors. 
 - New York :  Springer,  c2007. 
 - 2 v. (xx, 980 p., [8] p. of plates) :  ill. (some col.) ;  25 cm. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9780387286679 (2v. set : hd.bd.) 
<br/><br/><label>LCCN: </label>2006926451 
<br/><br/><label>Nat. Bib. Agency Control No.: </label>977347508  GyFmDB 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning probe microscopy.<br/>Nanoelectronics.
<br/><br/><label>LC Class. No.: </label>QH212.S33  / S395 2007 
<br/><br/><label>Dewey Class. No.: </label>502/.8/25