TY  - BOOK
AU  - Kalinin,S.V.
AU  - Gruverman,A.
TI  - Scanning probe microscopy : Volume-2: electrical and electromechanical phenomena at the nanoscale 
SN  - 9780387286679 (2v. set : hd.bd.)
AV  - QH212.S33 S395 2007
U1  - 502/.8/25 22
PY  - 2007///
CY  - New York
PB  - Springer
KW  - Scanning probe microscopy
KW  - Nanoelectronics
N1  - Includes bibliographical references and index
UR  - http://www.loc.gov/catdir/enhancements/fy0818/2006926451-t.html
UR  - http://www.loc.gov/catdir/enhancements/fy0818/2006926451-d.html
ER  -