Tolan, Metin,  1965- <br/><br/>
X-ray scattering from soft-matter thin films :  materials science and basic research / 
Metin Tolan. 
 - Berlin ;  New York :  Springer,  c1999. 
 - viii, 197 p. :  ill. ;  24 cm. 
 - Springer tracts in modern physics ;  148 .
<br/><br/>Includes bibliographical references (p. [179]-191) and index. 
<br/><br/><label>ISBN: </label>3540651829 (alk. paper) 
<br/><br/><label>LCCN: </label>98046724  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Thin films, Multilayered--Scattering.<br/>X-rays--Scattering.
<br/><br/><label>LC Class. No.: </label>QC1  / .S797 vol. 148 
<br/><br/><label>Dewey Class. No.: </label>530.4/275