TY  - BOOK
AU  - Tolan,Metin
TI  - X-ray scattering from soft-matter thin films: materials science and basic research 
SN  - 3540651829 (alk. paper)
AV  - QC1 .S797 vol. 148
U1  - 530.4/275 21
PY  - 1999///
CY  - Berlin, New York
PB  - Springer
KW  - Thin films, Multilayered
KW  - Scattering
KW  - X-rays
N1  - Includes bibliographical references (p. [179]-191) and index
ER  -