TY  - BOOK
AU  - Browning, Nigel D.
TI  - Characterization of High Tc Materials and Devices by Electron Microscopy
SN  - 9780511534829
PY  - 2000///
PB  - Cambridge University Press
UR  - http://opacrri.rri.local.net/cgi-bin/koha/opac-retrieve-file.pl?id=d8dbdb73846c50a167a4cb13899bbe1b
ER  -