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Optical scattering : measurement and analysis / John C. Stover. by
Edition: 2nd ed.
Material type:  Text; Format:
print
; Literary form:
Not fiction
Publication details: Bellingham, Wash., USA : SPIE Optical Engineering Press, c1995
Availability: Items available for loan: Raman Research Institute Library (1)Call number: 535.22 STO.
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Soft X-ray optics / Eberhard Spiller. by
Material type: Text; Format:
print
; Literary form:
Not fiction
Publication details: Bellingham, Wash., USA : SPIE Optical Engineering Press, c1994
Availability: Items available for loan: Raman Research Institute Library (1)Call number: 535A SPI.
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Liquid crystal materials, devices, and applications X and Projection displays X : 19-21 January 2004, San Jose, California, USA / Liang-Chy Chien, Ming H. Wu, chairs/editors ; sponsored ... by IS & T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering. by Series: Electronic Imaging Science and Technology Symposium. Proceedings of Electronic Imaging Science and Technology ; | Proceedings of SPIE--the International Society for Optical Engineering ; v. 5289.
Material type: Text; Format:
print
; Literary form:
Not fiction
Publication details: Bellingham, Wash., USA : SPIE, c2004
Other title:
- Projection displays X
- Projection displays 10
- Projection displays ten
- Electronic imaging science and technology
Availability: Items available for loan: Raman Research Institute Library (1)Call number: 538.9LC(063) SPIE-5289.
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Optics for EUV, X-ray, and gamma-ray astronomy : 4-7 August 2003, San Diego, California, USA / Oberto Citterio, Stephen L. O'Dell, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering. by Series: Proceedings of SPIE--the International Society for Optical Engineering ; v. 5168.
Material type: Text; Format:
print
; Literary form:
Not fiction
Publication details: Bellingham, Wash., USA : SPIE, c2004
Other title: - EUV, X-ray, and gamma-ray astronomy
Availability: Not available: Raman Research Institute Library: Checked out (1).
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MOEMS display, imaging, and miniaturized microsystems IV : 25-26 January 2006, San Jose, California, USA / Hakan Ürey, David L. Dickensheets, Bishnu P. Gogoi, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering. by Series: Proceedings of SPIE--the International Society for Optical Engineering ; v. 6114.
Material type: Text; Format:
print
; Literary form:
Not fiction
Publication details: Bellingham, Wash., USA : SPIE, c2006
Availability: Items available for loan: Raman Research Institute Library (1)Call number: 621.38.032.3(063) SPIE-6114.
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