Raman Research Institute Library OPAC

Raman Research Institute Library OPAC

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1.
Automatic testing and evaluation of digital integrated circuits / James T. Healy. by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Reston, Va. : Reston Pub. Co., c1981
Availability: Items available for loan: Raman Research Institute Library (1)Call number: 621.382.4D HEA.

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2.
Demystifying mixed-signal test methods / Mark Baker. by Series: Demystifying technology series (Amsterdam, Netherlands)
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Amsterdam ; Boston : Newnes, c2003
Online resources:
Availability: Items available for loan: Raman Research Institute Library (1)Call number: 621.382.4 BAK.

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