| 000 | 01503cam a22003737a 4500 | ||
|---|---|---|---|
| 001 | 14353045 | ||
| 005 | 20191017120510.0 | ||
| 008 | 060425s2007 nyuaf b 001 0 eng d | ||
| 010 | _a 2006926451 | ||
| 016 | 7 |
_a977347508 _2GyFmDB |
|
| 020 | _a9780387286679 (2v. set : hd.bd.) | ||
| 035 | _a(OCoLC)ocm78202876 | ||
| 040 |
_aOHX _dYDXCP _dAGL _dUAB _dDLC |
||
| 042 | _alccopycat | ||
| 050 | 0 | 0 |
_aQH212.S33 _bS395 2007 |
| 072 | 7 |
_aQH _2lcco |
|
| 072 | 7 |
_aTA _2lcco |
|
| 082 | 0 | 0 |
_a502/.8/25 _222 |
| 245 | 0 | 0 |
_aScanning probe microscopy : Volume-2 _belectrical and electromechanical phenomena at the nanoscale / _cSergei Kalinin, Alexei Gruverman, editors. |
| 246 | 3 | 0 | _aElectrical and electromechanical phenomena at the nanoscale |
| 260 |
_aNew York : _bSpringer, _cc2007. |
||
| 300 |
_a2 v. (xx, 980 p., [8] p. of plates) : _bill. (some col.) ; _c25 cm. |
||
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 | _aScanning probe microscopy. | |
| 650 | 0 | _aNanoelectronics. | |
| 700 | 1 |
_aKalinin, S. V. _q(Sergeĭ Vasilʹevich) |
|
| 700 | 1 |
_aGruverman, A. _q(Alexei) |
|
| 856 | 4 | 1 |
_3Table of contents only _uhttp://www.loc.gov/catdir/enhancements/fy0818/2006926451-t.html |
| 856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/enhancements/fy0818/2006926451-d.html |
| 906 |
_a7 _bcbc _ccopycat _d2 _encip _f20 _gy-gencatlg |
||
| 942 |
_2udc _cBK |
||
| 999 |
_c24633 _d24633 |
||