000 01366cam a22003977a 4500
001 14923276
005 20191025162059.0
008 070711s2008 gw a b 001 0 eng d
010 _a 2007932728
015 _a07,N34,0607
_2dnb
015 _a08,A11,0810
_2dnb
020 _a9783540719243
028 5 2 _a11903109
035 _a(OCoLC)ocn153582346
040 _aYDXCP
_dBTCTA
_dBAKER
_dUUM
_dIXA
_dOHX
_dCUY
_dDEBBG
_dDLC
042 _alccopycat
050 0 0 _aQC793.5.E62
_bL54 2008
082 0 4 _a537.56
_222/ger
084 _a530
_2sdnb
084 _aUH 6200
_2rvk
100 1 _aLiebl, Helmut.
245 1 0 _aApplied charged particle optics /
_cHelmut Liebl.
260 _aBerlin :
_bSpringer,
_cc2008.
300 _ax, 130 p. :
_bill. ;
_c25 cm.
504 _aIncludes bibliographical references and index.
650 0 _aElectron optics.
650 0 _aParticle beams.
650 0 7 _aElektronenoptik.
_2swd
650 0 7 _aIonenoptik.
_2swd
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/enhancements/fy1303/2007932728-d.html
856 4 1 _3Table of contents only
_uhttp://www.loc.gov/catdir/enhancements/fy1303/2007932728-t.html
906 _a7
_bcbc
_ccopycat
_d2
_eepcn
_f20
_gy-gencatlg
942 _2udc
_cBK
999 _c25752
_d25752