000 00379nam a2200157Ia 4500
008 160615s9999 xx 000 0 und d
100 _aJOWETT(Charles Eric)
245 _aSemiconductor devices: testing and evaluation
260 _aLondon
260 _bBusiness Books
260 _c1974
300 _avii p. + 134
942 _cBooks
999 _c9849
_d9849