Raman Research Institute Library OPAC

Raman Research Institute Library OPAC

Characterization and metrology for ULSI technology 2005/ (Record no. 24325)

MARC details
000 -LEADER
fixed length control field 01543cam a22003497a 4500
001 - CONTROL NUMBER
control field 14064244
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20191014160934.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 050804s2005 nyua b 101 0 eng
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER
LC control number 2005931820
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 0735402779
035 ## - SYSTEM CONTROL NUMBER
System control number (CStRLIN)PASGA3124406-B
040 ## - CATALOGING SOURCE
Original cataloging agency DLC
Modifying agency DLC
042 ## - AUTHENTICATION CODE
Authentication code lccopycat
050 00 - LIBRARY OF CONGRESS CALL NUMBER
Classification number TK7874.76
Item number .I56 2005
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.39/5
Edition number 22
111 2# - MAIN ENTRY--MEETING NAME
Meeting name or jurisdiction name as entry element International Conference on Characterization and Metrology for ULSI Technology
Date of meeting (2005 :
Location of meeting Richardson, Tex.)
245 10 - TITLE STATEMENT
Title Characterization and metrology for ULSI technology 2005/
Statement of responsibility, etc. editors, David G. Seiler ... [et al.]
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Melville, N.Y. :
Name of publisher, distributor, etc. American Institute of Physics,
Date of publication, distribution, etc. 2005.
300 ## - PHYSICAL DESCRIPTION
Extent xx, 667 p. :
Other physical details ill. ;
Dimensions 28 cm. +
Accompanying material 1 CD-ROM (4 3/4 in.)
490 1# - SERIES STATEMENT
Series statement AIP conference proceedings,
International Standard Serial Number 0094-243X ;
Volume/sequential designation v. 788
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note Includes bibliographical references and index.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Integrated circuits
General subdivision Ultra large scale integration
Form subdivision Congresses.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Integrated circuits
General subdivision Ultra large scale integration
Form subdivision Congresses
-- Software.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name <a href="Seiler, David G.">Seiler, David G.</a>
710 2# - ADDED ENTRY--CORPORATE NAME
Corporate name or jurisdiction name as entry element National Institute of Standards and Technology (U.S.)
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
Uniform title AIP conference proceedings ;
Volume/sequential designation no.788.
856 42 - ELECTRONIC LOCATION AND ACCESS
Materials specified Publisher description
Uniform Resource Identifier <a href="http://www.loc.gov/catdir/enhancements/fy0663/2005931820-d.html">http://www.loc.gov/catdir/enhancements/fy0663/2005931820-d.html</a>
906 ## - LOCAL DATA ELEMENT F, LDF (RLIN)
a 7
b cbc
c copycat
d 2
e ncip
f 20
g y-gencatlg
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Universal Decimal Classification
Koha item type Books
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Home library Current library Date acquired Total Checkouts Full call number Barcode Date last seen Price effective from Koha item type
    Universal Decimal Classification     Raman Research Institute Library Raman Research Institute Library 07.11.2006   621.382.4(063) AIP-788 24157 08.07.2020 07.11.2006 Books
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