Raman Research Institute Library OPAC

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X-ray scattering from soft-matter thin films : materials science and basic research / Metin Tolan.

By: Material type: TextTextSeries: Springer tracts in modern physics ; 148Publication details: Berlin ; New York : Springer, c1999.Description: viii, 197 p. : ill. ; 24 cmISBN:
  • 3540651829 (alk. paper)
Subject(s): DDC classification:
  • 530.4/275 21
LOC classification:
  • QC1 .S797 vol. 148
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Includes bibliographical references (p. [179]-191) and index.

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