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	1.	Digital circuit testing and testability by LALA(Parag K) Material type: Text; Format: print ; Literary form: Not fiction Publication details: San Diego ; Academic Press ; 1997 Availability: Items available for loan: Raman Research Institute Library (1)Call number: 621.382.4D LAL. Place hold Add to cart (remove)
	2.	Self-checking and fault-tolerant digital design / Parag K. Lala. by Lala, Parag K, 1948- Material type: Text; Format: print ; Literary form: Not fiction Publication details: San Francisco : Morgan Kaufmann, c2001 Availability: Items available for loan: Raman Research Institute Library (1)Call number: 621.382.4D LAL. Place hold Add to cart (remove)

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