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Characterization and metrology for ULSI technology 2005/ editors, David G. Seiler ... [et al.]
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TextSeries: AIP conference proceedings ; no.788.Publication details: Melville, N.Y. : American Institute of Physics, 2005.Description: xx, 667 p. : ill. ; 28 cm. + 1 CD-ROM (4 3/4 in.)ISBN: - 0735402779
- 621.39/5 22
- TK7874.76 .I56 2005
| Item type | Current library | Call number | Status | Date due | Barcode | |
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Raman Research Institute Library | 621.382.4(063) AIP-788 (Browse shelf(Opens below)) | Available | 24157 |
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| 621.382.4 ZHA Silicon microchannel heat sinks : | 621.382.4(021) HNA A user's handbook of integrated circuits | 621.382.4(063) Gallium arsenide for devices and integrated circuits : | 621.382.4(063) AIP-788 Characterization and metrology for ULSI technology 2005/ | 621.382.41 SAG Principles of analog electronics / | 621.382.4D (083) MOT CMOS Integrated circuits. | 621.382.4D (083) MOT-1 Memory data |
Includes bibliographical references and index.
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