Atomic and nuclear analytical methods : XRF, Mössbauer, XPS, NAA and ion-beam spectroscopic techniques / H.R. Verma.
Material type: TextPublisher number: 10908259Publication details: Berlin ; New York : Springer, c2007.Description: xiv, 375 p. : ill. ; 24 cmISBN:- 9783540302773 (acidfree paper)
- XRF, Mössbauer, XPS, NAA and ion-beam spectroscopic techniques
- QC454.A8 V47 2007
- 530
- UM 2200
Item type | Current library | Call number | Status | Date due | Barcode | |
---|---|---|---|---|---|---|
Books | Raman Research Institute Library | 543.42 VER (Browse shelf(Opens below)) | Available | 24612 |
Includes bibliographical references (p. [341]-364) and index.
X-ray fluorescence (XRF) and particle-induced X-ray emission (PIXE) -- Rutherford backscattering spectroscopy -- Elastic recoil detection -- Mössbauer spectroscopy (MS) -- X-ray photoelectron spectroscopy -- Neutron activation analysis -- Nuclear reaction analysis and particle-induced gamma-ray emission -- Accelerator mass spectroscopy (AMS) -- Appendixes.
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